Fine alignment IC handler and method for assembling same

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

3241581, G01R 3102

Patent

active

058699767

ABSTRACT:
The apparatus of the present invention includes a frame for attaching the clamp of a hand test socket to a workpress assembly of a high-speed IC handler. The frame attaches to a workpress assembly. Utilizing the clamp of a test socket recycles frequently unused test socket parts and eliminates the need for custom fabricated workpress assembly components. The method for adapting the hand test socket for use on the workpress assembly includes the steps: providing a test socket having a base and a top cover, the top cover including a clamp; removing the top cover and the clamp; configuring the clamp for use in a workpress assembly; and attaching the clamp to the workpress assembly.

REFERENCES:
patent: 5519332 (1996-05-01), Wood et al.
patent: 5634267 (1997-06-01), Farnworth et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fine alignment IC handler and method for assembling same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fine alignment IC handler and method for assembling same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fine alignment IC handler and method for assembling same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1952464

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.