Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-07-31
2007-07-31
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S191000, C375S226000, C375S227000
Reexamination Certificate
active
11486559
ABSTRACT:
Discovery of RJ assumes an Adjusted TIE Record for TJ from which DDJ has been removed. What remains is PJ+RJ, from whose Fourier Transform PJ is ‘synthetically de-convolved’ to leave just RJ: Calculate the Power Density Spectrum of PJ+RJ, and determine a threshold that indicates a PJ component. Identify in the PDS the largest frequency component that exceeds the threshold, otherwise there is no significant PJ and PJ+RJ can be taken as RJ. If a frequency component exceeds the threshold, take the largest and calculate what the convolution of it with the FT of the Transition Pattern would be if this circumstance were to occur in isolation, and then remove it from PJ+RJ. Repeat with continued iterations, until there are no further PJ components.
REFERENCES:
patent: 5222028 (1993-06-01), LaBarre et al.
patent: 2006/0045175 (2006-03-01), Draving et al.
Draving Steven D
Montijo Allen
Agilent Technologie,s Inc.
Bui Bryan
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