X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1989-01-23
1990-06-12
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Absorption
378157, 378207, G01N 2306
Patent
active
049339605
ABSTRACT:
A measuring method employing hard X-rays receives a hard X-ray beam from an X-ray source at first and second sensors substantially simultaneously. The beam directly reaches the first sensor but reaches the second sensor only after penetrating an object to be analyzed and a filter. The ratio of intensity values of the beams detected at the sensors is calculated so that filters producing X-ray absorption coefficients substantially independent of the thickness of objects to be analyzed are identified. Zt, the sum of the products of the atomic numbers Z and thicknesses t of each of the filter members of the identified filters, fall on a straight line graph of Zt versus X-ray tube voltage. Subsequently, filters are quickly selected from the graph during an analysis of objects of similar composition with hard X-rays. Alternatively, for a particular filter the proper X-ray tube voltage may be quickly selected from the straight line graph to produce an absorption coefficient substantially independent of object thickness.
REFERENCES:
patent: 3854049 (1974-12-01), Mistretta
patent: 4727561 (1988-02-01), Fujisaki
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