Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1999-07-16
2000-12-19
Bowers, Charles
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438216, 438784, 438DIG970, 257437, H01L 213115, H01L 310232, H01L 21302
Patent
active
061627372
ABSTRACT:
The present invention pertains to films comprising silicon and oxygen that are doped with carbon and the use of the films in integrated circuit technology, such as capacitor constructions, DRAM constructions, semiconductive material assemblies, etching processes, and methods for forming capacitors, DRAMs and semiconductive material assemblies.
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Research Disclosure 408124, "Combined Oxide and Nitride Spacer Deposition By Using Two Liquid Sources At One Low Temperature In Single Furnace," Apr. 1998.
Moore John T.
Weimer Ronald A.
Bowers Charles
Micro)n Technology, Inc.
Pert Evan
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