Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Patent
1995-02-03
1996-05-21
Chilcot, Richard
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
73790, G01D 116
Patent
active
055178600
ABSTRACT:
Measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width.
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Benecke, W., Silicon-microactuators: activation mechanisms and scaling problems, Tansducers '91. 1991 International Conference on Solid-State Sensors and Actuators, Digest of Technical Papers, Jun. 1991.
Johnson Melvin H.
Lin Li
Chilcot Richard
E. I. Du Pont de Nemours and Company
Fricke Hilmar L.
Noori Max
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