Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1997-01-10
1999-01-12
Pianalto, Bernard
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
118712, 118723CB, 427209, 4272481, 427294, 427523, 427569, B05D 100
Patent
active
058584501
ABSTRACT:
In formation of thin films on both surfaces of a substrate such as a lens or the like, a pair of cluster beam evaporation sources are provided in mutually separate manner in a film forming chamber. The substrate is disposed between the pair of cluster beam evaporation sources. The cluster beam evaporation source includes a crucible which is arranged to be inclined toward the substrate, or which has a nozzle on a lateral face opposed to the substrate.
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Fujimura Hidehiko
Kameyama Makoto
Sawamura Mitsuharu
Yokoyama Akihiko
Canon Kabushiki Kaisha
Pianalto Bernard
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