Film forming method and apparatus therefor

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined

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118712, 118723CB, 427209, 4272481, 427294, 427523, 427569, B05D 100

Patent

active

058584501

ABSTRACT:
In formation of thin films on both surfaces of a substrate such as a lens or the like, a pair of cluster beam evaporation sources are provided in mutually separate manner in a film forming chamber. The substrate is disposed between the pair of cluster beam evaporation sources. The cluster beam evaporation source includes a crucible which is arranged to be inclined toward the substrate, or which has a nozzle on a lateral face opposed to the substrate.

REFERENCES:
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patent: 4687939 (1987-08-01), Miyauchi et al.
patent: 4688130 (1987-08-01), Nakanouchi et al.
patent: 4799454 (1989-01-01), Ito
patent: 4882023 (1989-11-01), Wendman
patent: 5079224 (1992-01-01), Higuchi
patent: 5211994 (1993-05-01), Tsukazaki et al.
patent: 5340415 (1994-08-01), Koike et al.
patent: 5525158 (1996-06-01), Tsukazaki et al.

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