Film formation apparatus

Coating apparatus – Control means responsive to a randomly occurring sensed... – Condition of coated material

Reexamination Certificate

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C118S688000, C118S712000

Reexamination Certificate

active

11293219

ABSTRACT:
A film formation apparatus by which a film thickness can be precisely measured and whether the film quality is good or bad can be confirmed in a process of performing film formation according to the aerosol deposition method. The film formation apparatus includes: an aerosol generating unit for generating an aerosol by dispersing a raw material powder by a gas; a holding unit for holding a substrate on which a structure is to be formed; a nozzle for injecting the aerosol generated by the aerosol generating unit toward the substrate; and a measurement unit for measuring an electric potential of a film formation surface on the substrate.

REFERENCES:
patent: 5529815 (1996-06-01), Lemelson
patent: 5800615 (1998-09-01), Lambert et al.
patent: 2004/0026030 (2004-02-01), Hatono et al.
patent: 2004/0151978 (2004-08-01), Huang
patent: 2004/0197493 (2004-10-01), Renn et al.
patent: 2005/0098103 (2005-05-01), Miyoshi
patent: 2005/0115500 (2005-06-01), Vardelle et al.
patent: 2005/0120952 (2005-06-01), Vardelle et al.
patent: 2005/0199603 (2005-09-01), Vardelle et al.
patent: 2005/0223977 (2005-10-01), Vardelle et al.
patent: 2001-348659 (2001-12-01), None
patent: 2002-030421 (2002-01-01), None
Machine Translation of JP 2001-348659 (Submitted with.

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