Film-depositing target and preparation of phase shift mask...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C204S298130

Reexamination Certificate

active

07598004

ABSTRACT:
For the manufacture of a halftone phase shift mask blank comprising a transparent substrate and a translucent film of one or more layers having a controlled phase and transmittance, at least one layer of the translucent film comprising Si, Mo and Zr at the same time, a target comprising at least Zr and Mo in a molar ratio Zr/Mo between 0.05 and 5 is useful.

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patent: 2002/0058186 (2002-05-01), Nozawa et al.
patent: 2004/0058254 (2004-03-01), Nozawa et al.
patent: 2004/0072016 (2004-04-01), Okazaki et al.
patent: 0 436 741 (1991-07-01), None
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patent: 7-140635 (1995-06-01), None
patent: 2002-014458 (2002-01-01), None
patent: 2002-162726 (2002-06-01), None
patent: 2003-315977 (2003-06-01), None
patent: WO-97/44709 (1997-11-01), None
English Translation of the Japanese Office Action, mailed Nov. 12, 2008.

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