Film-based microwave and millimeter-wave circuits and sensors

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With waveguide or long line

Reexamination Certificate

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C174S254000, C361S749000

Reexamination Certificate

active

06903541

ABSTRACT:
Flexible multilayer microwave or mm-wave circuits and sensors are provided having at least (a) a first metallization layer, at least a portion of the first metallization layer being adapted for operation at a frequency ranging from 20 GHz to 100 GHz; (b) a second metallization layer, at least a portion of the second metallization layer being adapted for operation as a ground plane; (c) a dielectric substrate layer, the dielectric substrate layer being disposed between the first and second metallization layers; and (d) a plurality of conductive vias extending through the dielectric substrate layer and electrically connecting portions of the first and second metallization layers.

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Steve Berry et al, “Flex Tape Use for Area-Array Substrates Will Grow Rapidly,” Jan.-Feb. 2000, Chip Scale Review, Internet address: http://www.chipscalerview.com/archives/ES/issues/0100/flex3.html.
Ernsberger, Craig N. and Thomas, Sunil, “Colaminated Single and Multichip Package Development,” 1997 International Conference on Multichip Modules, pp. 134-141 (May 1997).
F. Alessandri et al., “Full-Wave Modeling of Via Hole Grounds in Microstrip by Three-Dimensional Mode Matching Technique,” 1992 IEEE MTT-S Digest, pp. 1237-1240, (month unavailable).

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