Field-testable integrated circuit and method of testing

Details Field-testable integrated circuit and method of testing Field-testable integrated circuit and method of testing

1995-04-06

1996-12-31

Nguyen, Vinh P.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 324763, G01R 3102

Patent

active

055897665

ABSTRACT:
A field-testable integrated circuit that includes a plurality of analog signal channels for receiving a respective analog signal during a normal mode of operation is provided. Individual test circuits are built-in within the integrated circuit for selecting respective ones of the plurality of channels to receive predetermined reference signals during a test mode of operation while uninterruptedly providing the normal mode of operation in any remaining unselected channels. Each test circuit includes a channel decoder responsive to predetermined channel select signals for producing a respective channel decoder output signal. A multiplexer is responsive to predetermined reference select signals and to the decoder output signal for supplying during the test mode of operation a selected one of the predetermined reference signals to the respective analog channel being coupled to the individual test circuit therein. A switching gate is responsive to the respective channel decoder output signal so that during the normal mode of operation the switching gate is in a respective conducting state for allowing the respective analog signal to pass therethrough while during the test mode of operation the switching gate is in a respective nonconductive state for interrupting the respective analog signal from passing therethrough.

REFERENCES:
patent: 4635259 (1987-01-01), Schinabeck et al.
patent: 4724379 (1988-02-01), Hoffman
patent: 4929888 (1990-05-01), Yoshida
patent: 4931723 (1990-06-01), Jeffrey et al.
patent: 4972144 (1990-11-01), Lyon et al.

Affiliated with

Also associated with

Rating

Field-testable integrated circuit and method of testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Field-testable integrated circuit and method of testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Field-testable integrated circuit and method of testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1144328