Patent
1984-07-18
1986-04-01
Buczinski, S. C.
357 53, 357 20, 357 52, H01L 2948, H01L 2906
Patent
active
H00000400
ABSTRACT:
The present invention relates to an improved Schottky barrier device wherein the leakage current present in the reverse bias mode attributed to the presence of an electric field at the Schottky barrier (18) is significantly reduced by the inclusion of one or more field shields (22), P.sup.+ -type diffusions located under the metal anode (16) of the Schottky barrier device at the Schottky barrier (18). The P.sup.+ -type field shields, which are disposed in a pattern on the surface of the Schottky barrier, reduce the surface electric field present, thereby significantly reducing the leakage current related thereto.
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patent: 4119446 (1978-10-01), Mastroianni
patent: 4134123 (1979-01-01), Shannon
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"High-Voltage Power Schottky. . .", IBM Technical Disclosure Bulletin, vol. 25, No. 5, Oct. 1982, pp. 2331-2333, Jambotkar.
"Electric-Field-Shielding Layers. . .", Electronics Letters, vol. 19, No. 15, Jul. 21, 1983, pp. 568-570, S. Nakashima et al.
Buchanan, Jr. William L.
Kohl James E.
Scott Robert S.
Wong Yiu-Huen
AT&T Bell Laboratories
Buczinski S. C.
Koba Wendy W.
Wallace Linda J.
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