Field programmable device having test provisions for fault detec

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Details

G06F 1122, G01R 3126

Patent

active

043205070

ABSTRACT:
A field programmable device having a memory cell member including regular bit lines, regular word lines, regular memory cells connected at the cross points of said regular bit lines and regular word lines, test bit or test word lines, and non-conductive and conductive test memory cells connected at the cross points of said regular bit or regular word lines and test word or test bit lines, wherein the conductivity of a test memory cell is determined by the "1" or "0" of the address signal by which the test word or test bit line to which the test memory cell is connected is selected.

REFERENCES:
patent: 3063636 (1962-11-01), Sierra
patent: 3221310 (1965-11-01), Reach, Jr.
patent: 3944800 (1976-03-01), Beck et al.
patent: 3995215 (1976-11-01), Chu et al.
patent: 4176258 (1979-11-01), Jackson

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