Field emission displays with reduced light leakage having an ext

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Low workfunction layer for electron emission

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257 9, 257755, 257757, 257764, 313311, H01L 2906, H01J 105

Patent

active

060640758

ABSTRACT:
Semiconductor devices may be made by forming a silicided layer on a silicon material such as that used to form the extractor of a field emission display. The silicided layer may be self-aligned with the emitter of a field emission display. If the silicided layer is treated at a temperature above 1000.degree. C. by exposure to a nitrogen source, the silicide is resistant to subsequent chemical attack such as that involved in a buffered oxide etching process.

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Wolf et al., Silicon Processing for the VLSI Era vol. 1: Process Technology, Lattice Press, pp. 386-388, 1986.

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