Field effect transistor with nitride compound

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

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Details

257194, 257195, 257410, 257411, H01L 310328, H01L 310336, H01L 31072, H01L 31109

Patent

active

059294671

ABSTRACT:
A GaN-type field effect transistor exhibits a large input amplitude by using a gate insulating film. A channel layer and a gate insulating film are sequentially laminated on a substrate with a buffer layer therebetween. A gate electrode is formed on the gate insulating film. A source electrode and a drain electrode are disposed at the both sides of the gate electrode and are electrically connected to the channel layer via openings. The channel layer is formed from n-type GaN. The gate insulating film is made from AlN, which exhibits excellent insulation characteristics, thus increasing the Schottky barrier and achieving a large input amplitude. If the FET is operated in the enhancement mode, it is operable in a manner similar to a Si-MOS-type FET, resulting in the formation of an inversion layer.

REFERENCES:
patent: 4030942 (1977-06-01), Keenan et al.
patent: 4642879 (1987-02-01), Kawata et al.
patent: 5447874 (1995-09-01), Grivna et al.

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