Patent
1977-03-24
1977-12-06
Miller, Jr., Stanley D.
357 23, 357 52, 357 53, 357 59, H01L 2934
Patent
active
040620409
ABSTRACT:
An improved field effect transistor structure which reduces a leakage phenomenon, termed the "sidewalk" effect, between the semiconductor substrate and a conductive silicon dioxide layer disposed over the substrate. The improvement comprises forming a layer of highly resistive, silicon dioxide or silicon oxynitride, which is between the conductive oxide and the silicon nitride layer which forms a portion of the gate insulator for the field effect transistor.
REFERENCES:
patent: 3793090 (1974-02-01), Barile et al.
patent: 3841926 (1974-10-01), Garnache et al.
patent: 3913126 (1975-10-01), Hooker et al.
Abbas Shakir Ahmed
Dockerty Robert Charles
Clawson Jr. Joseph E.
Galvin Thomas F.
IBM Corporation
Miller, Jr. Stanley D.
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