Patent
1988-09-28
1990-02-20
Mintel, William
357 2315, 357 52, 357 54, H01L 2966
Patent
active
049030990
ABSTRACT:
A field effect transistor for use as an ion sensor has a P-type silicon substrate on which are formed a source region and a drain region. An N-type isolation diffusion layer is formed on the outer peripheral surface of the silicon substrate and this diffusion layer is surrounded by an insulation layer. According to this arrangement, even when the potential of the electrolyte has been raised to a level which is positive with respect to the silicon substrate, an electrical isolation is established by the reverse dielectric strength exhibited by the P-N junction.
REFERENCES:
patent: 4305802 (1981-12-01), Koshiishi
patent: 4512870 (1985-04-01), Kohara et al.
patent: 4660065 (1987-04-01), Carvajal et al.
Wen et al., "Gate-Controlled Diodes for Ionic Concentration Measurement", IEEE Transactions on Electron Devices, vol. ED-26, No. 12 (Dec. 1979), pp. 1945-1951.
Hamatani Tetsuo
Ozawa Hideo
Sekiguchi Tetsushi
Takahashi Masao
Mintel William
Nihon Kohden Corp
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