Field-effect transistor comprising hollow cavity

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device

Reexamination Certificate

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Details

C257SE29257, C257SE29201, C257S330000, C257SE29255

Reexamination Certificate

active

07633099

ABSTRACT:
A field-effect transistor has: a substrate having a first cavity; a gate electrode buried in the substrate; and diffusion layers formed in the substrate and being in contact with the first cavity. A channel region is formed substantially perpendicular to a surface of the substrate between the diffusion layers.

REFERENCES:
patent: 4926225 (1990-05-01), Hosack
patent: 6232202 (2001-05-01), Hong
patent: 6285057 (2001-09-01), Hopper et al.
patent: 6544833 (2003-04-01), Kawakubo
patent: 6570217 (2003-05-01), Sato et al.
patent: 6727186 (2004-04-01), Skotnicki et al.
patent: 6743654 (2004-06-01), Coffa et al.
patent: 2005/0157571 (2005-07-01), Schaffer
patent: 5-198817 (1993-08-01), None
patent: 2000-012547 (2000-04-01), None
patent: 2002-026279 (2002-01-01), None
T. Sato et al., “SON (Silicon on Nothing) MOSFET using ESS (Empty Space in Silicon) technique for SoC applications,” IEEE, IEDM 01-809, 37.1.1-37.1.4, 2001, 4 pp.

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