Field effect transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S183000

Reexamination Certificate

active

06946691

ABSTRACT:
An MESFET is configured wherein a semiconductor layer structure including an i-AlGaAs buffer layer, an n-AlGaAs electron supply layer having an impurity doping density ranging from 1×1017cm−3to 1×1018cm−3and a layer thickness ranging from 1 nm to 10 nm, and an n-GaAs channel layer, all of which are sequentially deposited from the semi-insulating GaAs substrate side, is disposed on the semi-insulating GaAs substrate, a gate electrode is provided on the n-GaAs channel layer, and a source electrode and a drain electrode opposite to each other with the gate electrode interposed therebetween are provided.

REFERENCES:
patent: 5283448 (1994-02-01), Bayraktaroglu
patent: 5284782 (1994-02-01), Jeong et al.
patent: 6057566 (2000-05-01), Eisenbeiser et al.
patent: 6365925 (2002-04-01), Hase et al.
patent: 2002/0008249 (2002-01-01), Minetani
patent: 2004/0137673 (2004-07-01), Passlack et al.
R. E. Williams, et al. “Graded Channel FET's: Improved Linearity and Noise Figure”, IEEE Transactions on Electron Devices, vol. ED-25, No. 6, Jun. 1978, pp. 600-605.
James A. Adams, et al. “Short-Channel Effects and Drain-Induced Barrier Lowering in Nanometer-Scale GaAs MESFET's”, IEEE Transactions on Electron Devices, vol. 40, No. 6, Jun. 1993, pp. 1047-1052.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Field effect transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Field effect transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Field effect transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3370341

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.