Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate
2005-09-20
2005-09-20
Wilson, Allan R. (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Field effect transistor
C257S183000
Reexamination Certificate
active
06946691
ABSTRACT:
An MESFET is configured wherein a semiconductor layer structure including an i-AlGaAs buffer layer, an n-AlGaAs electron supply layer having an impurity doping density ranging from 1×1017cm−3to 1×1018cm−3and a layer thickness ranging from 1 nm to 10 nm, and an n-GaAs channel layer, all of which are sequentially deposited from the semi-insulating GaAs substrate side, is disposed on the semi-insulating GaAs substrate, a gate electrode is provided on the n-GaAs channel layer, and a source electrode and a drain electrode opposite to each other with the gate electrode interposed therebetween are provided.
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patent: 2002/0008249 (2002-01-01), Minetani
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R. E. Williams, et al. “Graded Channel FET's: Improved Linearity and Noise Figure”, IEEE Transactions on Electron Devices, vol. ED-25, No. 6, Jun. 1978, pp. 600-605.
James A. Adams, et al. “Short-Channel Effects and Drain-Induced Barrier Lowering in Nanometer-Scale GaAs MESFET's”, IEEE Transactions on Electron Devices, vol. 40, No. 6, Jun. 1993, pp. 1047-1052.
Mitsubishi Denki & Kabushiki Kaisha
Wilson Allan R.
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