Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate
2006-09-19
2008-10-07
Nguyen, Cuong Q (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Field effect transistor
C257S192000, C257S195000, C257S610000, C257S611000, C257S612000, C257S655000, C257S657000, C257SE29246, C257SE29247, C257SE29248, C257SE29249, C257SE29250, C257SE29251, C257SE29252, C257SE21403
Reexamination Certificate
active
07432538
ABSTRACT:
A field-effect transistor includes a channel layer having a channel and a carrier supply layer, disposed on the channel layer, containing a semiconductor represented by the formula AlxGa1-xN, wherein x is greater than 0.04 and less than 0.45. The channel is formed near the interface between the channel layer and the carrier supply layer or depleted, the carrier supply layer has a band gap energy greater than that of the channel layer, and x in the formula AlxGa1-xN decreases monotonically with an increase in the distance from the interface. The channel layer may be crystalline of gallium nitride. The channel layer may be undoped. X of the formula AlxGa1-xN of the carrier supply layer is greater than or equal to 0.15 and less than or equal to 0.40 at the interface.
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Chinese Office Action dated May 9, 2008 with English translation.
Hirata Koji
Kosaki Masayoshi
McGinn IP Law Group PLLC
Nguyen Cuong Q
Toyoda Gosei Co,., Ltd.
Tran Tran Q
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