Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate
2007-08-14
2007-08-14
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Field effect transistor
C257S200000, C257S201000, C257SE29091, C257SE29255, C257SE29264
Reexamination Certificate
active
10541583
ABSTRACT:
An electric-field control electrode (5) is formed between a gate electrode (2) and a drain electrode (3). A multilayered film including a SiN film (21) and a SiO2film (22) is formed below the electric-field control electrode (5). The SiN film (21) is formed so that a surface of an AlGaN electron supply layer (13) is covered with the SiN film (21).
REFERENCES:
patent: 5111256 (1992-05-01), Ohata et al.
patent: 6933544 (2005-08-01), Saito et al.
patent: 7173307 (2007-02-01), Hayashi et al.
patent: 2001/0015446 (2001-08-01), Inoue et al.
patent: 11-176839 (1999-07-01), None
patent: 2000-003919 (2000-01-01), None
patent: 2000-286428 (2000-10-01), None
patent: 2001-189324 (2001-07-01), None
patent: 2002-222860 (2002-08-01), None
patent: 2002-359256 (2002-12-01), None
U. K. Mishra et al., “AlGaN/GaN HEMTs-An Overview of Device Operation and Applications”, Proceedings of the IEEE, vol. 90, No. 6, Jun. 2002.
J. Li et al., “High Breakdown voltage GaN HFET with field plate”, Electronics Letters, 1stFeb. 2001, vol. 37, No. 3.
Y. Ando et al., “A 110-W AlGaN/GaN Heterojunction FET on Thinned Sapphire Substrate”.
Ando Yuji
Inoue Takashi
Kuzuhara Masaaki
Miyamoto Hironobu
Nakayama Tatsuo
Mandala Jr. Victor A.
NEC Corporation
Pert Evan
Young & Thompson
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