Metal treatment – Stock – Ferrous
Patent
1979-05-31
1982-03-23
Ozaki, G.
Metal treatment
Stock
Ferrous
29571, 29580, 29589, 29590, 148171, 148175, 357 15, 357 4, 357 68, H01L 2120, H01L 21302, H01L 2980
Patent
active
043216137
ABSTRACT:
A method of fabricating a field effect transistor comprising the steps of forming an active layer of semiconductor material, e.g. GaAs over the surface of a first substrate of semiconductor material, e.g., also GaAs, forming source, drain and gate electrodes over the surface of the active layer, applying a second substrate of insulating material to the surface of this structure, and removing the first substrate. To facilitate the removal of the GaAs first substrate by selective etching, a buffer layer of GaAlAs resistant to the GaAs etchant may be formed between the first substrate and active layer, which buffer layer is removed, following removal of the first substrate, using a selective etchant to which the GaAs active layer is resistant. A second gate electrode may be formed on the active layer following removal of the first substrate. The technique is particularly applicable to high frequency FET devices.
REFERENCES:
patent: 3621565 (1971-11-01), Sandstrom et al.
patent: 3823467 (1974-07-01), Shamash et al.
patent: 3914137 (1975-10-01), Huffman et al.
patent: 3930912 (1976-01-01), Wisbey
patent: 3972770 (1976-08-01), Stein
patent: 4048712 (1977-09-01), Buiatti
patent: 4049488 (1977-09-01), Tijburg
patent: 4136352 (1979-01-01), Moutou et al.
patent: 4193836 (1980-03-01), Youmans et al.
Hughes Brian T.
Vokes John C.
Wight David R.
Ozaki G.
The Secretary of State for Defence in Her Britannic Majesty's Go
LandOfFree
Field effect devices and their fabrication does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Field effect devices and their fabrication, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Field effect devices and their fabrication will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1653419