Metal treatment – Stock – Ferrous
Patent
1979-05-31
1982-04-13
Ozaki, G.
Metal treatment
Stock
Ferrous
29571, 29580, 29589, 29590, 148171, 148172, H01L 2980, H01L 21208
Patent
active
043250734
ABSTRACT:
A method of fabricating a field effect transistor comprising the steps of forming an active layer of semiconductor material (GaAs) over a surface of a first substrate of semiconductor material (GaAs), applying a second substrate of insulating material, e.g. glass, over the surface of the active layer, removing the first substrate so that the active layer is now supported on the insulating second substrate, and forming source, drain and gate electrodes over the free surface of the active layer. To facilitate removal of the GaAs first substrate by selective etching, a buffer layer of GaAlAs resistant to the GaAs etchant, may be formed between the active layer and the first substrate, which buffer layer is removed, following removal of first substrate, using a selective etchant to which the GaAs active layer is resistant. The technique is particularly applicable to high frequency FETs requiring a very thin active channel region interfaced to a substrate having good insulating properties.
REFERENCES:
patent: 3621565 (1971-11-01), Sandstrom et al.
patent: 3823467 (1974-07-01), Shamash et al.
patent: 3914137 (1975-10-01), Huffman et al.
patent: 3930912 (1976-01-01), Wisbey
patent: 3972770 (1976-08-01), Stein
patent: 4048712 (1977-09-01), Buiatti
patent: 4049488 (1977-09-01), Tijburg
patent: 4136352 (1979-01-01), Moutou et al.
patent: 4193836 (1980-03-01), Youmans et al.
Hughes Brian T.
Redstone Reuben
Vokes John C.
Wight David R.
Ozaki G.
The Secretary of State for Defence in Her Britannic Majesty's Go
LandOfFree
Field effect devices and their fabrication does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Field effect devices and their fabrication, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Field effect devices and their fabrication will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1419561