Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1994-10-17
1996-01-16
NcGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
G01C 1964
Patent
active
054852749
ABSTRACT:
An integrated optics chip is employed as a Michelson interferometer for stabilizing the wavelength of a light source in a fiber optic Sagnac interferometer for measuring rotation rate. A statistically-independent second signal component is applied in addition to a resetting digital phase ramp dependent on rotation rate to a phase modulator incorporated in the integrated optics chip (MIOC). The second signal component optimizes the working point of the phase modulator. By employing such statistically-independent variation of the phase modulation, the light wavelength-dependent measuring signal of the Michelson interferometer may be demodulated from the detector read-out signaled used for readjustment of the light-source wavelength via a light-source temperature and/or injection current change. In open loop operation, scale factor variations can be compensated using the light wavelength-dependent measuring signal.
REFERENCES:
patent: 5123741 (1992-06-01), Spahlinger
patent: 5311279 (1994-05-01), Wendler
patent: 5365338 (1994-11-01), Bramson
Kramsky Elliott N.
Litef GmbH
NcGraw Vincent P.
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