Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1997-11-17
2000-05-02
Kim, Robert H.
Optics: measuring and testing
Material strain analysis
By light interference detector
356351, 356352, G01B 902
Patent
active
060579110
ABSTRACT:
Absolute strain is measured by providing a coherent beam of light and separating the coherent beam of light into first and second beams which are in quadrature with one another and which have different polarization angles. The first and second beams are combined in a manner which maintains the different polarization angles thereof, so as to form a combined beam. The combined beam is then applied to a Fabry-Perot strain sensor so as to form a reflected combined beam. The reflected combined beam is then separated into first and second reflected beams having different polarization angles. The intensity of the first and second reflected beams is then sensed, so as to determine a change in the etalon length of the Fabry-Perot sensor. The change in etalon length is indicative of the absolute strain sensed.
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Anderson Terry J.
Hoch Jr. Karl J.
Kim Robert H.
Lee Andrew H.
Northrop Grumman Corporation
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