Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1989-09-08
1991-09-10
Turner, Samuel
Optics: measuring and testing
By particle light scattering
With photocell detection
356350, 25022719, G01B 902
Patent
active
050468480
ABSTRACT:
The process and apparatus of at least two sensor configurations enable both the location and severity of an environmental disturbance on an optic path to be measured.
REFERENCES:
patent: 4881817 (1989-11-01), Kim et al.
patent: 4885462 (1989-12-01), Dakin
patent: 4898468 (1990-02-01), Udo
Cone Gregory A.
McDonnell Douglas Corporation
Scholl John P.
Stout Donald E.
Turner Samuel
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