FFT accelerated display mode

Details FFT accelerated display mode FFT accelerated display mode

2007-01-02

2007-01-02

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C324S076110

Reexamination Certificate

active

10890958

ABSTRACT:
An FFT accelerated display mode for a spectrum analyzer processes time domain samples in increments as they are received until a complete measurement frame of samples is processed to provide a desired frequency resolution. After a first set of time domain samples is received, a spectrum analysis display is provided having a coarse frequency resolution. Then the spectrum analysis display is updated at intervals as more and more time domain samples are received until the complete measurement frame is processed, providing the desired frequency resolution for the spectrum analysis display.

REFERENCES:
patent: 3883726 (1975-05-01), Schmidt
patent: 5353233 (1994-10-01), Oian et al.
patent: 6006245 (1999-12-01), Thayer

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