Optics: measuring and testing – Lamp beam direction or pattern
Patent
1985-02-28
1987-07-21
McGraw, Vincent P.
Optics: measuring and testing
Lamp beam direction or pattern
356213, 356222, G01J 104, G01J 142
Patent
active
046814361
ABSTRACT:
A system for measuring laser pulse durations in the range of ten nanoseconds to one femtosecond to an accuracy of one femtosecond, includes a primary pulse sampler, a ten component beam splitter array, optical delay lines whose settings are microprocessor controlled, a ten section interaction chamber with ten sets of ion detectors and a pulse envelope and pulse energy display monitors. The system has applications in chemistry, calibration of fast timing circuits and in the development of short pulse lasers.
REFERENCES:
patent: 4256962 (1981-03-01), Horton et al.
patent: 4327285 (1982-04-01), Bradley
patent: 4434399 (1984-02-01), Mourou et al.
patent: 4447151 (1984-05-01), McLellan et al.
patent: 4548496 (1985-10-01), Roberts et al.
Honda et al, "Measurements of Picosecond Laser Pulses from Mode-Locked Nd: Yag Laser", 1976 Conference on Precision Electromagnetic Measurements, Boulder, Colo., U.S.A. (Jun. 28-Jul. 1, 1976) pp. 33-34.
Ching Neng H.
Hughes John L.
Marson Ralph G.
Norman Michael J.
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