Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2007-06-19
2007-06-19
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
C398S183000
Reexamination Certificate
active
10963270
ABSTRACT:
The invention proposes a method for feedback control, in which a portion of a data signal is split and rectified and the signal intensity is detected with slow speed electronics for improving the control of a delay line interferometer (DLI) used in optical data transmission. A control signal is generated and fed back to the DLI based on the detected signal intensity. The invention further proposes a device provided with a DLI, a first and second optoelectronic component, and a differential amplifier.
REFERENCES:
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patent: 5114226 (1992-05-01), Goodwin et al.
patent: 6271959 (2001-08-01), Kim et al.
patent: 2004/0208647 (2004-10-01), Gill et al.
Pennickx, D. et al. “Optical Differential Phase Shif Keying (DPSK) direct detection considered as a duobinary signal”. 27th Proceeding of the European Conference on Optical Communication. 2001, vol. 3, pp. 456-457.
Schlenk Ralph
Stahl David
Lucent Technologies - Inc.
Lyons Michael A.
Toatley , Jr. Gregory J.
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