Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-08-26
1995-12-05
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324178, 73105, G01P 366
Patent
active
054732573
ABSTRACT:
A system and method are provided for establishing the feed rate of a workpiece along a feed path with respect to a machine device. First and second sensors each having first and second sensing electrodes which are electrically isolated from the workpiece are positioned above, and in proximity to the desired surfaces of the workpiece along a feed path. An electric field is developed between the first and second sensing electrodes of each sensor and capacitance signals are developed which are indicative of the contour of the workpiece. First and second image signals representative of the contour of the workpiece along the feed path are developed by an image processor. The time delay between corresponding portions of the first and second image signals are then used to determine the feed rate based upon the separation of the first and second sensors and the amount of time between corresponding portions of the first and second image signals.
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Novak James L.
Wiczer James J.
Brown Glenn W.
Sandia Corporation
Wieder Kenneth A.
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