Registers – Systems controlled by data bearing records – Operations analysis
Reexamination Certificate
2008-07-22
2008-07-22
Le, Uyen-Chau N (Department: 2876)
Registers
Systems controlled by data bearing records
Operations analysis
C235S375000, C235S380000
Reexamination Certificate
active
07401728
ABSTRACT:
Communication between machines in an event-based manufacturing system. In an event-based manufacturing system, material-specific data obtained for a material produced during a first manufacturing operation is used to govern a second manufacturing operation to decrease the likelihood of at least a delay event, a waste event, or poor quality of the product.
REFERENCES:
patent: 3693430 (1972-09-01), Menary
patent: 3946212 (1976-03-01), Nakao et al.
patent: 4652481 (1987-03-01), Sjoberg
patent: 4819176 (1989-04-01), Ahmed et al.
patent: 5063507 (1991-11-01), Lindsey et al.
patent: 5086397 (1992-02-01), Schuster et al.
patent: 5087137 (1992-02-01), Burnard et al.
patent: 5109241 (1992-04-01), Keeney
patent: 5121467 (1992-06-01), Skeirik
patent: 5282001 (1994-01-01), Watson
patent: 5311438 (1994-05-01), Sellers et al.
patent: 5325305 (1994-06-01), Rezaei
patent: 5359525 (1994-10-01), Weyenberg
patent: 5379427 (1995-01-01), Hiroshima
patent: 5432702 (1995-07-01), Barnett
patent: 5471614 (1995-11-01), Kakimoto
patent: 5478990 (1995-12-01), Montanari et al.
patent: 5488223 (1996-01-01), Austin et al.
patent: 5532928 (1996-07-01), Stanczyk et al.
patent: 5540796 (1996-07-01), Fries
patent: 5564841 (1996-10-01), Austin et al.
patent: 5595618 (1997-01-01), Fries et al.
patent: 5630070 (1997-05-01), Dietrich et al.
patent: 5638519 (1997-06-01), Haluska
patent: 5644493 (1997-07-01), Motai et al.
patent: 5673194 (1997-09-01), Cipelletti et al.
patent: 5737496 (1998-04-01), Frye et al.
patent: 5751914 (1998-05-01), Coley et al.
patent: 5778155 (1998-07-01), Hepner
patent: 5781911 (1998-07-01), Young
patent: 5801965 (1998-09-01), Takagi et al.
patent: 5828989 (1998-10-01), Zvonar et al.
patent: 5890159 (1999-03-01), Sealby et al.
patent: 5896294 (1999-04-01), Chow et al.
patent: 5909176 (1999-06-01), Schrott et al.
patent: 5971315 (1999-10-01), Kojo
patent: 6026250 (2000-02-01), Goto et al.
patent: 6027022 (2000-02-01), Hong
patent: 6038486 (2000-03-01), Saitoh et al.
patent: 6128540 (2000-10-01), Van Der Vegt et al.
patent: 6138121 (2000-10-01), Costa et al.
patent: 6141647 (2000-10-01), Meijer et al.
patent: 6144893 (2000-11-01), Van Der Vegt et al.
patent: 6178418 (2001-01-01), Singer
patent: 6184924 (2001-02-01), Schneider et al.
patent: 6195590 (2001-02-01), Powell
patent: 6212530 (2001-04-01), Kadlec
patent: 6227643 (2001-05-01), Purcell et al.
patent: 6240633 (2001-06-01), Kent et al.
patent: 6247128 (2001-06-01), Fisher et al.
patent: 6259367 (2001-07-01), Klein
patent: 6266656 (2001-07-01), Ohno
patent: 6267291 (2001-07-01), Blankenship et al.
patent: 6291003 (2001-09-01), Riemann et al.
patent: 6294997 (2001-09-01), Paratore et al.
patent: 6298454 (2001-10-01), Schleiss et al.
patent: 6308107 (2001-10-01), Conboy et al.
patent: 6317700 (2001-11-01), Bagne
patent: 6353835 (2002-03-01), Lieuwen
patent: 6354493 (2002-03-01), Mon
patent: 6362738 (2002-03-01), Vega
patent: 6366824 (2002-04-01), Nair et al.
patent: 6401098 (2002-06-01), Moulin
patent: 6415192 (2002-07-01), Satoguchi
patent: 6418450 (2002-07-01), Daudenarde
patent: 6451154 (2002-09-01), Grabau et al.
patent: 6501501 (2002-12-01), Miyazawa
patent: 6560611 (2003-05-01), Nine et al.
patent: 6564171 (2003-05-01), Peterson et al.
patent: 6606947 (2003-08-01), Frossard et al.
patent: 6640151 (2003-10-01), Somekh et al.
patent: 6671818 (2003-12-01), Mikurak
patent: 6672212 (2004-01-01), Ferlitsch
patent: 6672508 (2004-01-01), Kaye
patent: 6673637 (2004-01-01), Wack et al.
patent: 6693511 (2004-02-01), Seal
patent: 6693539 (2004-02-01), Bowers et al.
patent: 6694284 (2004-02-01), Nikoonahad et al.
patent: 6708129 (2004-03-01), Pasadyn et al.
patent: 6769280 (2004-08-01), Cao et al.
patent: 6829559 (2004-12-01), Bultman et al.
patent: 6891627 (2005-05-01), Levy et al.
patent: 7032816 (2006-04-01), Markham et al.
patent: 7124059 (2006-10-01), Wetzer et al.
patent: 7124101 (2006-10-01), Mikurak
patent: 7162318 (2007-01-01), Brearley et al.
patent: 7197469 (2007-03-01), Hegde et al.
patent: 7266476 (2007-09-01), Coburn et al.
patent: 2002/0082899 (2002-06-01), Aley
patent: 2002/0087440 (2002-07-01), Blair et al.
patent: 2002/0113125 (2002-08-01), Schuessler et al.
patent: 2002/0155628 (2002-10-01), Bulaga et al.
patent: 2002/0177959 (2002-11-01), Williams et al.
patent: 2002/0178069 (2002-11-01), Walker et al.
patent: 2002/0186007 (2002-12-01), Cao et al.
patent: 2004/0134504 (2004-07-01), Lane
patent: 0217032 (1987-04-01), None
patent: 0606626 (1994-07-01), None
patent: 0652539 (1995-05-01), None
patent: 0875365 (1997-05-01), None
patent: 1065620 (2001-01-01), None
patent: 9942939 (1999-08-01), None
patent: 0020939 (2000-04-01), None
patent: 0180146 (2001-10-01), None
patent: 0193036 (2001-12-01), None
patent: 0248955 (2002-06-01), None
Ruegsegger et al, IEEE Transactions on Semiconductor Manufacturing, vol. 12, No. 4, Nov. 1999.
Chaudhuri et al, “An Overview of Data Warehousing and OLAP Technology,” ACM Sigmod Record, vol. 27, Issue 1, pp. 65-74, Mar. 1997, New York, NY, U.S.A.
Hughes, “Designing the Financial Data Warehouse,” Intelligent Enterprise, www.intelligententerprise.com/021115/518warehouse1—1.shtml, Nov. 15, 2002, 4 pages, U.S.A.
Chapman et al., “CRISP-DM 1.0: Step-by-Step Data Mining Guide,” The CRISP-DM Consortium, Aug. 2000, 78 pages, U.S.A.
McFarlane, “Auto-ID Based Control,” White Paper, Auto-ID Centre, Institute for Manufacturing, University of Cambridge, Feb 1, 2002, 19 pages, Cambridge, UK.
Wong, “Integration of Auto-ID Tagging System with Holonic Manufacturing Systems,” White Paper, Auto-ID Centre, Institute for Manufacturing, University of Cambridge, Sep. 1, 2001, 52 pages, Cambridge, UK.
Ashayeri et al, “Computer Integrated Manufacturing in the Chemical Industry,” Production & Inventory Management Journal, vol. 37, No. 1, 10 pages, First Quarter 1996, U.S.A.
Yeager, “Mead's ERP System Integrates ‘Best of Breed’ Software,” PIMA's North American Papermaker, vol. 82, No. 4, 4 pages, Apr. 2000, U.S.A.
“Taratec Develops New Solution to Help Life Sciences Industry Comply with FDA Regulation,” LIMSource, http://www.limsource.com/whatnew/indnews/1to201.html, 2 pages, Jan. 16, 2001, U.S.A.
Babcock, “The Ask Master: An XML Technology Makes Retrieving Web Data Much Easier,” Interactive Week, Sep. 24, 2001, p. 48, U.S.A.
Tacker et al., “A Fuzzy Logic/Neural System Approach to Signal Processing in Large Scale Decision Systems,” 1989 IEEE Conference on Systems, Man, and Cybernetics, vol. III, pp. 1094-1097, Nov. 14, 1989, U.S.A.
Hillman, “Integrating Neural Nets and Expert Systems,” Al Expert, Jun. 1990, pp. 54-59, U.S.A.
Simon, “The Engineering of Distributed Control Systems,” http://www.plcopen.org/leading—persons/rene—simon.htm, 2 pages, accessed on Feb. 14, 2003, U.S.A.
Bonadio et al., “For Remote Stations, Fieldbus + PLC + Radio = Economical Network,” InTech, Feb. 1, 1999, pp. 46-49, U.S.A.
Reilly, “Buyers to Suppliers: Manage My Inventory,” Purchasing, vol. 129, No. 1, Jul. 13, 2000, 5 pages, U.S.A.
Weiss et al., “Predictive Data Mining: A Practical Guide,” Morgan Kaufmann Publishers, 1998, pp. 203-205, U.S.A.
Wieser, “Integration of Process Control Systems and Laboratory Information Systems Into the Logistic Chain,” Automatisierungstechnische Praxis, vol. 39, No. 2, Feb. 1997, pp. 26-28.
Barber Douglas Gordon Barron
Fuller Paul D.
Hise John Harland
Ihde Sheryl Annette
Lindsay Jeffrey Dean
Armstrong Teasdale LLP
Kimberly--Clark Worldwide, Inc.
Le Uyen-Chau N
LandOfFree
Feed-forward control in event-based manufacturing systems does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Feed-forward control in event-based manufacturing systems, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Feed-forward control in event-based manufacturing systems will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2792208