Feed control element used in substrate inspection and method and

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Using radiant energy

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324537, 324752, G01R 31308

Patent

active

057479992

ABSTRACT:
A non-contact voltage feeding apparatus for inspecting a circuit pattern on a substrate. The feeding apparatus includes a feed control element having a laminated structure as a light probe. A voltage is applied to the light probe disposed on the feeding side of the circuit pattern to be inspected by irradiating the light probe with a laser beam. An electrostatic capacitance coupling under a non-contact system is provided on the detection side, and an electrical condition of the coupling is extracted from the circuit and a waveform processing is performed on the detected signals so as to make it possible to test respective conductive paths of the circuit pattern.

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patent: 5442714 (1995-08-01), Iguchi
patent: 5519334 (1996-05-01), Dawson
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