Image analysis – Pattern recognition – Feature extraction
Patent
1996-12-12
1999-05-04
Tran, Phuoc
Image analysis
Pattern recognition
Feature extraction
382118, 382225, G06K 946, G06K 966
Patent
active
059012447
ABSTRACT:
A feature extraction system for statistically analyzing a set of samples of feature vectors to calculate a feature being an index for a pattern identification, which is capable of identifying confusing data with a high robustness. In this system, a storage section stores a feature vector inputted through an input section and a neighborhood vector selection section selects a specific feature vector from the feature vectors existing in the storage section. The specific feature is a neighborhood vector close in distance to the feature vector stored in the storage section. Further, the system is equipped with a feature vector space production section for outputting a partial vector space. The partial vector space is made to maximize the local scattering property of the feature vector when the feature vector is orthogonally projected to that space.
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patent: 5710833 (1998-01-01), Moghaddam et al.
Matthew A. Turk, et al: "Face Recognition Using Eigenfaces", IEEE, 1991, pp. 586-591.
M. Kirby, et al: "Application of the Karhunen-Loevre Procedure for the Characterization of Human Faces", IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 12, No. 1; Jan. 1990; pp. 103-108.
K. Fukunaga: "Feature Extraction and Linear Mapping for Signal Representation", Statistical Pattern Recognition; 1990; pp. 399-413.
Nagao Kenji
Souma Masaki
Matsushita Electric - Industrial Co., Ltd.
Tran Phuoc
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