Image analysis – Histogram processing – For setting a threshold
Patent
1992-05-29
1994-06-28
Mancuso, Joseph
Image analysis
Histogram processing
For setting a threshold
382 14, 382 39, G06K 968
Patent
active
053254457
ABSTRACT:
Feature classification using a novel supervised statistical pattern recognition approach is described. A tree-like hierarchical decomposition of n-dimensional feature space is created off-line from an image processing system. The hierarchical tree is created through a minimax-type decompositional segregation of n-dimensional feature vectors of different feature classifications within the corresponding feature space. Each cell preferably contains feature vectors of only one feature classification, or is empty, or is of a predefined minimum cell size. Once created, the hierarchical tree is made available to the image processing system for real-time defect classification of features in a static or moving pattern. Each feature is indexed to the classification tree by locating its corresponding feature vector in the appropriate feature space cell as determined by a depth-first search of the hierarchical tree. The smallest leaf node which includes that feature vector provides the statistical information on the vector's classification.
REFERENCES:
patent: 3623015 (1971-11-01), Schmitz et al.
patent: 4613519 (1986-09-01), Yacobi
patent: 4770184 (1988-09-01), Greene, Jr. et al.
patent: 4783802 (1988-11-01), Takebayashi et al.
patent: 4975974 (1990-12-01), Nishijima et al.
patent: 4975975 (1990-12-01), Filipski
patent: 4977603 (1990-12-01), Irie et al.
patent: 5058182 (1991-10-01), Kuan et al.
patent: 5075896 (1991-12-01), Wilcox et al.
patent: 5077807 (1991-12-01), Bokser
patent: 5142593 (1992-08-01), Kasano
patent: 5181259 (1993-01-01), Rorvig
patent: 5185813 (1993-02-01), Tsujimoto
patent: 5187751 (1993-02-01), Tanaka
Aristides A. G. Requicha, "Representations for Rigid Solids: Theory, Methods, and Systems," Computing Surveys, vol. 12, No. 4, pp. 437-463, Dec. 1980.
EKTRON VEREDUS.RTM. "Surface Flaw Detection and Analysis System for Metal Coil, Plastic, Paper Roll Products, and other Web Processed Materials"; EKTRON Applied Imaging, Inc., 1991.
Duda et al., Pattern Classification and Scene Analysis, Chapter 2, pp. 10-20; Chapter 3, pp. 44-49; Chapter 4, pp. 85-105 and Chapter 6, pp. 189-190, 1973.
Winston, Patrick Henry, Artificial Intelligence, Second Edition, Chapter 4, pp. 87-88 & 114-117, 1984.
Fu, K. S., Syntactic Pattern Recognition and Applications, Chapter 3, pp. 79-97, 1982.
Eastman Kodak Company
Mancuso Joseph
Radigan Kevin P.
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