Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-07-19
2011-07-19
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C714S025000
Reexamination Certificate
active
07983858
ABSTRACT:
A fault test apparatus for testing a fault on each signal line in a circuit under test including signal lines includes a controller, which calculates a value of a fault excitation function for a fault signal line, using the fault excitation function representing a fitness result of a predetermined fault excitation condition between the fault signal line having a fault among the signal lines under test in the circuit under test and at least one of adjacent signal lines adjacent to the fault signal line and falling within a predetermined range from the fault signal line, based on layout information between the fault signal line and at least one adjacent signal line adjacent to the fault signal line, manufacturing parameter information, and timing information, and then, determines whether or not a dynamic fault is excited on the fault signal line based on the value of the fault excitation function.
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Aikyo Takashi
Emori Michiaki
Higami Yoshinobu
Nakao Michinobu
Ohmae Hideo
Raymond Edward
Semiconductor Technology Academic Research Center
Wenderoth , Lind & Ponack, L.L.P.
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