Fault severity check and source identification

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Details

C704S224000, C704S225000, C704S229000, C704S230000, C370S210000, C370S242000, C702S108000

Reexamination Certificate

active

07373282

ABSTRACT:
A fault severity check and source identification method for a frequency domain instrument accesses acquired reflection data for a transmission line under test. From the acquired data reflection surfaces are isolated as a function of distance. Each reflection surface is examined to produce a frequency response profile and a worst-case reflection response to determine fault severity. The frequency response profile may also be correlated in a pattern recognition algorithm with known reference source profiles to determine the source identification for the fault.

REFERENCES:
patent: 4314249 (1982-02-01), Onoe
patent: 5974379 (1999-10-01), Hatanaka et al.
patent: 6542112 (2003-04-01), Chen et al.
patent: 2003/0035376 (2003-02-01), Chen
Biggerstaff, W.F., A Transmission Line and Radiating System Measurement, Jun. 1957, vol. 9, Issue 1, pp. 75-81.
Seeger, John. Microwave Theory, Components, and Devices. pp. 83-107.

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