Fault position identification system for a semiconductor...

Details Fault position identification system for a semiconductor... Fault position identification system for a semiconductor...

2007-07-03

2007-07-03

Le, Que T. (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

C250S559400

Reexamination Certificate

active

11052850

ABSTRACT:
A fault position identification system for a semiconductor device includes: a storage unit storing test data of the semiconductor device; a test result analyzer generating test parameters of the semiconductor device, based on failure information of a failure occurred in the semiconductor device; an emission controller controlling the semiconductor device to perform a circuit operation in which the failure occurs, by transmitting the test data corresponding to the test parameters to the semiconductor device; and an observation apparatus observing light emitted from a fault position and identifying the fault position.

REFERENCES:
patent: 6553546 (2003-04-01), Murakami
patent: 6995564 (2006-02-01), Ang et al.

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