Excavating
Patent
1995-09-28
1997-06-17
Beausoliel, Jr., Robert W.
Excavating
364578, 364580, G01R 3128, G06G 748, G05B 1902
Patent
active
056404034
ABSTRACT:
A fault diagnosis method for inferring a faulty position in an LSI includes the steps of testing the actual LSI to obtain pass/fail pin information, extracting a combinational circuit by tracing from one of a fail output pin, simulating the extracted combinational circuit using the expected outputs of flip flops located at input side of the combinational circuit as input test vectors, and inferring the faulty position by comparing the pass/fail information with the simulation results for expected values on each node in the combinational circuit for the input test vectors. The method is repeated if the faulty position is not inferred in the combinational circuit by extracting another combinational circuit preceding the combinational circuit.
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T. Nakamura et al. "Novel Image-based LSI Diagnostic Method Using E-beam without CAD Database" IEEE, 1992, pp. 164-169.
B. Rogel-Favila et al. "Model-Based Fault Diagnosis of Sequential Circuits and its Acceleration" IEEE, 1991, pp. 224-229.
Ishiyama Toshio
Klein Donald
Beausoliel, Jr. Robert W.
NEC Corporation
Tu Trinh L.
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