Fault block detecting system using abnormal current

Details Fault block detecting system using abnormal current Fault block detecting system using abnormal current

1997-06-06

1998-12-15

Decady, Albert

Excavating

371 24, G06F 1100

Patent

active

058504044

ABSTRACT:
In a semiconductor device formed by a plurality of logic blocks, a plurality of functional test patterns are generated and transmitted to the semiconductor device, and it is determined whether an abnormal current flows through the semiconductor device. When an abnormal current is detected, a fault block is determined in accordance with a table for storing the functional test patterns and the logic blocks operated by the functional test patterns.

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New Application of Laser Beam to Failure Analysis of LSI With Multi-Metal Layers, by M. Sanada, Microelectron. Reliab., vol. 33, No. 7, pp. 993-1009, 1993.
"Evaluation and Detection of CMOS-LSI With Abnormal IDDQ," by M. Sanada, Microelectron. Reliab., vol. 35, No. 3, pp. 619-629, 1995.

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