Faster processing of multiple spatially-heterodyned direct...

Optics: measuring and testing – By light interference – Having light beams of different frequencies

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S484000

Reexamination Certificate

active

07423763

ABSTRACT:
Systems and methods are described for faster processing of multiple spatially-heterodyned direct to digital holograms. A method includes of obtaining multiple spatially-heterodyned holograms, includes: digitally recording a first spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis; digitally recording a second spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis; Fourier analyzing the recorded first spatially-heterodyned hologram by shifting a first original origin of the recorded first spatially-heterodyned hologram including spatial heterodyne fringes in Fourier space to sit on top of a spatial-heterodyne carrier frequency defined as a first angle between a first reference beam and a first object beam; applying a first digital filter to cut off signals around the first original origin and performing an inverse Fourier transform on the result; Fourier analyzing the recorded second spatially-heterodyned hologram by shifting a second original origin of the recorded second spatially-heterodyned hologram including spatial heterodyne fringes in Fourier space to sit on top of a spatial-heterodyne carrier frequency defined as a second angle between a second reference beam and a second object beam; and applying a second digital filter to cut off signals around the second original origin and performing an inverse Fourier transform on the result, wherein digitally recording the first spatially-heterodyned hologram is completed before digitally recording the second spatially-heterodyned hologram and a single digital image includes both the first spatially-heterodyned hologram and the second spatially-heterodyned hologram.

REFERENCES:
patent: 4812042 (1989-03-01), Yokokura et al.
patent: 5299035 (1994-03-01), Leith et al.
patent: 5339152 (1994-08-01), Horn
patent: 5410397 (1995-04-01), Toeppen
patent: 5515183 (1996-05-01), Hashimoto
patent: 5671042 (1997-09-01), Sciammarella
patent: 5877873 (1999-03-01), Bashaw et al.
patent: 5995251 (1999-11-01), Hesselink et al.
patent: 6078392 (2000-06-01), Thomas et al.
patent: 6262818 (2001-07-01), Cuche et al.
patent: 6525821 (2003-02-01), Thomas et al.
patent: 6597446 (2003-07-01), Klooster et al.
patent: 6747771 (2004-06-01), Thomas et al.
patent: 6809845 (2004-10-01), Kim et al.
patent: 7119905 (2006-10-01), Bingham et al.
patent: 7148969 (2006-12-01), Thomas et al.
patent: 2004/0021871 (2004-02-01), Psaltis et al.
patent: 2004/0042015 (2004-03-01), Price
patent: 2004/0042056 (2004-03-01), Price et al.
patent: 2004/0057089 (2004-03-01), Voelkl
patent: 2004/0130762 (2004-07-01), Thomas et al.
patent: 2005/0046858 (2005-03-01), Hanson et al.
patent: 06282213 (1994-07-01), None
Kruschke O. et al. Holographic interferometic microscope of complete displacement determination: Optical Engineering SPIE USA, vol. 36, nol. 9, Sep. 1997, pp. 2448-2456, XP002316736 ISSN: 0091-3286.
Khare K et al. “Direct sampling and demodulation of carrier-frequency signals” Optics Communications, North-Holland Publishing Co. Amsterdam, NL, vol. 211, No. 1-6, Oct. 1, 2002, pp. 85-94, XP004382791 ISSN: 0030-4018.
Pedrini G. et al. “Quantitative evaluation of two-dimensional dynamic deformations using digital holography” Optics and laser technology, Elsevier Science Publishers BV., Amsterdam, NL, vol. 29, No. 5, Jul. 1997, pp. 249-256, XP004090206 ISSN: 0030-3992.
Invention of Holography: D. Gabor, Proc. Roy. Soc. London Ser. A A197, 459 (1949).
Invention of Sideband (Hetrodyne) Holography: E. Leith and J. Upatnieks, J. Opt. Soc. Am. 52, 1123 (1962) and J. Opt. Soc. Am. 53 1377 (1963).
Mathematical Treatise on Holography: J.B. Develis and G.O. Reynolds, Theory and Application of Holography, Addison-Wesley, Reading, MA, 1967.
Holographic Interferometry: L.O. Heflinger, R.F. Wuerker, and R.E. Brooks, J. Appl. Phys. 37, 642 (1966).
Discussion of Focused Holography (used for holographic interferometry): F.E. Jahoda, R.A. Jeffries and G.A. Sawyer, Appln. Opt. 6, 1407 (1967).
Interferogram Analysis: Digital Fringe Pattern Measurement Techniques, M. Kujawinska, (edited by D.W. Robinson and G.T. Reid), IOP Publishing Ltd., Bristol, England, 1993).
Holographic Interferometry: Principles and Methods, K. Creath and T. Kreis (edited by K. Rastogi), Springer-Verlag, New York, New York, 1994.
Papers by E. Voelkl on Fourier transform analysis of electron holography: E. Voelkl, L.F. Allard, and B. Frost, J. Microscopy 180, pt. 1, Oct. 1995, pp. 39-50.
E. Voelkl, L.F. Allard, A. Datye, B. Frost, Ultramicroscopy 58, (1995), pp. 97-103.
Edgar Volkl, “Introduction to Electron Holography”, pp. 133-138, published by Kluwer Academic/Plenum Publishers, New York, 1999.
Jacob et al., “High Resolution Photomask Transmission and Phase Measurement Tool”, Metrology, Inspection and Process Control for Microlithography XVI, Proceedings of SPIE vol. 4689, pp. 70-82, 2002.
Thomas et al., “Direct to Digital Holography for Semiconductor Wafer Defect Detection and Review”, Design, Process Integration, and Characterization for Microelectronics, Proceedings of SPIE vol. 4692, pp. 180-194, 2002.
E. Voelkl, L.F. Allard, ICEM-13 (13th International Conference on Electron Microscopy), 17-22, Jul. 1994, Paris, France, Proceedings, p. 287.
Volkl, E., et al. “Advanced Electron Holography: A New Algorithm for Image Processing and Standardized Quality Test for the FEG Electron Microscope”, ULTRAMICROSCOPY 58 (1995) 97-103.
Volkl, E., et al., “A Software Package for the Processing and Reconstruction of Electron Holograms”, Journal of Microscopy, vol. 180, pt. 1, Oct. 1995, pp. 39-50.
Leith, E.N. “Reconstructed Wavefronts and Communication Theory”, Journal of Optical Society of America, vol. 52, No. 10, Oct. 1962.
Gabor, D., et al., “Microscopy by Reconstructed Wave-Fronts”, Research Laboratory, Aug. 1948, pp. 454-487.
Leith, E.N., et al., “Wavefront Reconstruction with Continuous-Tone Objects”, Journal of the Optical Society of America, vol. 53, No. 12, Dec. 1963.
Leith, E.N., et al., “Wavefront Reconstruction with Diffused Illumination and Three Dimensional Objects”, Journal of the Optical Society of America, vol. 54, No. 11, Nov. 1964.
North, J.C., et al., “Holographic Interferometry”, Journal of Applied Physics, vol. 37, No. 2, Feb. 1966.
Kujawinska, M., “Digital Fringe Pattern Measurement Techniques”, Interferogram Analysis 1993.
DeVelis, J.B., et al., “Theory and Applications of Holography”, (1967).
Jahoda, F.C., et al., “Fractional-Fringe Holographic Plasma Interferometry”, Applied Optics, Aug. 1967, vol. 6, No. 8, pp. 1407-1410.
Jahoda, F.C., et al., “Holographic Interferometry Cookbook”, Los Alamos Scientific Laboratory, Oct. 1972.
Rastogi, P.K., “Holographic Interferometry”, Optical Science Center, University of Arizona, vol. 68 (1994).
Volkl, E., et al., “The Extended Fourier Algorithm. Application in Discrete Optics and Electron Holography”, High Temperature Materials Laboratory, Jul. 1994.
International Search Report from PCT/US2004/012710, Jan. 7, 2005.
Written Opinion of the International Searching Authority from PCT/US2004/012710, Jan. 7, 2005.
International Search Report from PCT/US2004/012798, Feb. 16, 2005.
Written Opinion of the International Searching Authority from PCT/US2004/012798, Jan. 7, 2005.
International Search Report from PCT/US2004/012618, Feb. 21, 2005.
Written Opinion of the International Searching Authority from PCT/US2004/012618, Feb. 21, 2005.
Mendoza Santoyo F. et al. “Multi-pulsed digital holography applied to full 3D measurements of dynamic events” Proceedings of the SPIE—The International Society for Optical Engineering SPIE-INT. Soc. Opt. Eng. USA, vol. 4420, Oct. 15, 1999, pp. 132-138, XP002311234 ISSN: 0277-786X.
Pedrini G. et al. “Pulsed digital holographic interferometry with 694- and 347-nm wavelengths” Applied Optics, Optic

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Faster processing of multiple spatially-heterodyned direct... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Faster processing of multiple spatially-heterodyned direct..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Faster processing of multiple spatially-heterodyned direct... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3984384

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.