Fast time-of-flight mass spectrometer with improved data...

Details Fast time-of-flight mass spectrometer with improved data... Fast time-of-flight mass spectrometer with improved data...

2006-08-01

2006-08-01

Nguyen, Kiet T. (Department: 2881)

Radiant energy

Ionic separation or analysis

Methods

C250S287000

Reexamination Certificate

active

07084393

ABSTRACT:
Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.

REFERENCES:
patent: 5367162 (1994-11-01), Holland et al.
patent: 5777325 (1998-07-01), Weinberger et al.
patent: 6373052 (2002-04-01), Hoyes et al.
patent: 6747271 (2004-06-01), Gonin et al.
patent: 6800847 (2004-10-01), Axelsson
patent: 6909090 (2005-06-01), Gonin et al.
patent: 2002/0175292 (2002-11-01), Whitehouse et al.

Affiliated with

Also associated with

Rating

Fast time-of-flight mass spectrometer with improved data... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fast time-of-flight mass spectrometer with improved data..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fast time-of-flight mass spectrometer with improved data... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3700754