Fast testing of D/A converters

Details Fast testing of D/A converters Fast testing of D/A converters

1997-03-19

1998-11-24

Hoff, Marc S.

Coded data generation or conversion

Converter calibration or testing

341144, H03M 110

Patent

active

058413820

ABSTRACT:
Testing of digital-to-analog converters is accelerated by applying one or more different approaches. One approach relies on a switched capacitor, which lowers the overall capacitance of the converter during testing, thereby reducing the settling time for each code value. Another approach makes the duration of each testing step a function of the particular code value, rather than using the worst-case settling time for each testing step. Yet another approach uses a sequence of non-consecutive code values to determine whether each switch in the converter is functional. Using non-consecutive code values permits the use of partial settling times during converter testing. Each of the approaches can be used to accelerate the testing of D/A converters, whether they have linear or folded resistor strings.

REFERENCES:
patent: 3349195 (1967-10-01), Gray
patent: 3918046 (1975-11-01), Rivers
patent: 4266292 (1981-05-01), Regan et al.
patent: 4641246 (1987-02-01), Halbert et al.
patent: 5162744 (1992-11-01), Koozer

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