Data processing: measuring – calibrating – or testing – Calibration or correction system – Length – distance – or thickness
Patent
1997-10-30
2000-11-14
Shah, Kamini
Data processing: measuring, calibrating, or testing
Calibration or correction system
Length, distance, or thickness
382124, 382210, 356376, G06K 962, G01B 1124
Patent
active
061482706
ABSTRACT:
A distance measuring device includes first and second cameras, first and second Fourier pattern data generating sections, a pattern processing section, and a distance measuring section. The two cameras are spaced apart from each other by a predetermined distance. The first Fourier pattern data generating section generates first two-dimensional Fourier pattern data by performing two-dimensional discrete Fourier transform for image data picked up by the first camera as first pattern data. The second Fourier pattern data generating section generates second Fourier two-dimensional pattern data by performing two-dimensional discrete Fourier transform for image data picked up by the second camera as second pattern data. The pattern processing section synthesizes the first and second Fourier two-dimensional pattern data, and performs either two-dimensional discrete Fourier transform or two-dimensional discrete inverse Fourier transform for the synthesized data. The distance measuring section obtains a correlation peak in a range excluding a portion near a reference position in a correlation component area appearing in the synthesized Fourier two-dimensional pattern data, and measures the distance to a target on the basis of the distance from a reference position in the correlation component area to the position of the correlation peak.
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Kobayashi Koji
Nakajima Hiroshi
Shah Kamini
Yamatake-Honeywell Co. Ltd.
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