Active solid-state devices (e.g. – transistors – solid-state diode – Schottky barrier – Avalanche diode
Reexamination Certificate
2006-08-15
2006-08-15
Wilczewski, Mary (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Schottky barrier
Avalanche diode
C257S484000, C257S104000, C257S603000
Reexamination Certificate
active
07091572
ABSTRACT:
A fast recovery diode has a single large area P/N junction surrounded by a termination region. The anode contact in contact with the central active area extends over the inner periphery of an oxide termination ring and an EQR metal ring extends over the outer periphery of the oxide termination ring. Platinum atoms are diffused into the back surface of the device. A three mask process is described. An amorphous silicon layer is added in a four mask process, and a plurality of spaced guard rings are added in a five mask process.
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Andoh Kohji
Chiola Davide
Fimiani Silvestro
Rue Redda Fabrizio
International Rectifier Corporation
Lewis Monica
Ostrolenk Faber Gerb & Soffen, LLP
Wilczewski Mary
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