Image analysis – Pattern recognition – Template matching
Reexamination Certificate
2006-11-28
2006-11-28
Mariam, Daniel (Department: 2624)
Image analysis
Pattern recognition
Template matching
C382S305000
Reexamination Certificate
active
07142718
ABSTRACT:
An accumulation transformation method for fast pattern search accurately locates general patterns of interest. The method can be used for fast invariant search to match patterns of interest in images where the searched pattern varies in size or orientation or aspect ratio, when pattern appearance is degraded, when the pattern is partially occluded, where the searched image is large, multidimensional, or very high resolution, or where the pattern size is large. The accumulation transformations of the input image are determined based upon the searched projection directions. Projection profile result images are derived from the accumulation transformed input image and used for fast matching with template pattern projection profiles.
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Kim Donglok
Lee Shih-Jong J.
Oh Seho
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