Fast, high-resolution, indirect measurement of a physical value

Details Fast, high-resolution, indirect measurement of a physical value Fast, high-resolution, indirect measurement of a physical value

2006-08-15

2006-08-15

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

With auxiliary means to condition stimulus/response signals

C324S607000, C324S691000

Reexamination Certificate

active

07091725

ABSTRACT:
A measurement method or system for measuring a physical value comprises, during a same clock cycle, forming an input signal, a reference signal and an offset signal, the input signal including a parasitic value and a useful measurement value. A relationship between the input signal where the parasitic value has been cancelled out, and the reference signal is derived. From this relationship, a value relating to the physical value is determined. The input signal, reference signal and offset signal are respectively associated with an input element, a reference element and a parasitic element. All elements have a common driving signal, and the parasitic value is depending on the common driving signal. The fact that different signals are formed during a same measurement cycle, and that these signals are sufficient to obtain the desired physical value, makes the measurement method or system of the present invention faster than prior art measurement methods or systems: only one conversion cycle is needed against two cycles needed for dual slope analog-to-digital conversion.

REFERENCES:
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patent: 2002/0113586 (2002-08-01), Ho et al.
patent: EP-1102405 (2001-05-01), None

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