Excavating
Patent
1994-04-04
1995-08-15
Beausoliel, Jr., Robert W.
Excavating
371 275, G11C 2900
Patent
active
054426413
ABSTRACT:
A fast high-density data compression circuit adapted to semiconductor integrated circuits of the memory type including an ABIST unit. This circuit, which compares the data-out signals output by the memory unit with the expected data generated by the ABIST unit to deliver a signal on a cycle by cycle basis, which is indicative of the fail
o fail status of the memory unit.
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Yan "Compact Testing with Intermediate Signature Analysis" 1991 IEEE VLSI for Symposium pp. 47-52.
Karpovsky et al. "Built in Self-Diagnostic by Space-Time Compression of Test Responses" IEEE VLSI Test Symposium 1992 pp. 149-154.
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Lampin et al. "Design and Application Trade-offs Between High-Density and High Speed ASICS" Computer Design-ICCD 1990 Int. Conf. pp. 269-272.
Beranger Herve
Joly Frederic
Rapoport Stuart
Beausoliel, Jr. Robert W.
International Business Machines - Corporation
Palys Joseph E.
Schnurmann H. Daniel
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