Fast contact measuring machine

Geometrical instruments – Gauge – Coordinate movable probe or machine

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Details

33556, 3355803, 33832, G01B 728

Patent

active

051291525

ABSTRACT:
A pair of anvils (50,54) are respectively fixed to and movable with respect to a base (12). Each anvil has a surface (52,56) of given topography, preferably a flat surface. The surfaces are spaced in parallel from one another at an initial gap so that the anvil surfaces do not contact one another. The movable anvil (50) can be moved away from the fixed anvil (54), such as by a cam (44) and follower (38), and the surfaces are maintained in parallel preferably by a parallelogram constant force flexure assembly (26). The cam is set to maintain a minimum space between the surfaces and to protect them from damage, in the event the movable anvil were accidently dropped towards the non-movable anvil. Parallelism between the surfaces is initially established preferably by an adjustment mechanism comprising a trivet/turnbuckle assembly (58). A displacement transducer (22) is coupled to the movable anvil for measuring the gap as determined by the thickness of a gage or product placed between the surfaces of the anvils. By orienting the movable anvil above the stationary anvil, gravity can be used to urge the movable anvil into contact with the gage or product.

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Brochure (16 sheets) "Sip 305M Gage Measuring Center" by Societe Genevoise D'Instruments de Physique, American Sip Corporation, Brochure No. 1543, ITG 7604.60.
Brochure (32 sheets) "Heidenhain Metro" May 1987, by Dr. Johannes Heidenhain GmbH, MXM Corp., Brochure 208 464 22.60.5/87 NEW943.
"Engineering Metrology" by K. J. Hume, MacDonald & Co. (Publishers) Ltd., London, 1950, Title Page and Reverse Side, pp. 250 and 255-259.

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