Fast bit-error-rate (BER) test

Details Fast bit-error-rate (BER) test Fast bit-error-rate (BER) test

2006-07-18

2006-07-18

Tran, Khai (Department: 2637)

Pulse or digital communications

Synchronizers

C714S704000, C702S117000

Reexamination Certificate

active

07079612

ABSTRACT:
A bit-error-rate (BER) test is a crucial test for wireless devices to pass, since a device with a high BER does not perform at its best. BER tests are both costly and difficult to perform due to a delay incurred by the device under test (DUT)215and the testing hardware that is variable in nature. Because the delay is variable, a hardware BER test that can compensate for the delay is difficult to build and a software BER test that can easily compensate for the delay is very slow. The present invention provides a method and apparatus that can compensate for the variable delay. By doing so, a hardware BER test, which is considerably faster than a software BER test, is easily implemented.

REFERENCES:
patent: 6661836 (2003-12-01), Dalal et al.
patent: 6820234 (2004-11-01), Deas et al.
patent: 2002/0073374 (2002-06-01), Danialy et al.
patent: 2003/0229466 (2003-12-01), Garcia

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