Fast and accurate AC RMS and DC measurement

Details Fast and accurate AC RMS and DC measurement Fast and accurate AC RMS and DC measurement

2006-03-21

2006-03-21

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S070000, C702S190000, C702S198000

Reexamination Certificate

active

07016796

ABSTRACT:
A small microcontroller or a DSP may be used to process digital signals representative of a measurement. Furthermore, special RMS AC measurement or DC noise rejection algorithms may have to be run on the microcontroller or the DSP. Other implementations may use custom digital logic, such as FPGAs, to process the digital signals. The DSP may not have enough capacity to store and process all data at the same time. Certain physical limitations are inherent to the DSP architectures, such as the trade-off of on-board memory size vs. speed, power consumption, and physical chip size. As a result, the RMS AC Measurement and the DC Noise rejection algorithms enable computational devices such as DSP's to perform sophisticated and accurate RMS measurements for waveforms ranging from DC to high frequency. The RMS AC Measurement and the DC Noise rejection algorithms uses on the on-the-fly computation of interpolated window values. As a result, the RMS AC Measurement and the DC Noise rejection algorithms can use any window, rather than being constrained to computationally efficient sincNwindows.

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patent: 2002/0180419 (2002-12-01), Britz

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