Fast acting FET test circuit for SIR diagnostics

Details Fast acting FET test circuit for SIR diagnostics Fast acting FET test circuit for SIR diagnostics

1996-05-22

1997-09-09

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324505, 340438, G01R 3128, B60Q 100, G01M 1900

Patent

active

056660650

ABSTRACT:
The firing circuit of an inflatable restraint system is tested to verify operation of two FETs in series with a squib which are used to apply current to the squib. For the test the squib is biased to an intermediate voltage and each FET is turned on alone to apply battery or ground voltage to the squib. High and low voltage detectors sense the voltage excursion past respective thresholds to verify FET operation, and a logic circuit immediately turns off the FET to result in a very short FET on time. If a short is present before the FET is commanded on, a detector and the logic circuit prevents FET conduction to avoid firing or degrading the squib.

REFERENCES:
patent: 5081442 (1992-01-01), Ito et al.
patent: 5166880 (1992-11-01), Furvi
patent: 5268643 (1993-12-01), Aso et al.

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